ELLIPSOMETRY OF UNSUPPORTED AND EMBEDDED THIN FILMS

Spectroscopic ellipsometry of composite thin films with embedded Bi nanocrystals

Spectroscopic ellipsometry together with an effective medium model is used to determine simultaneously the effective refractive index, thickness, and metal volume fraction of thin nanocomposite films. The films are formed by Bi nanocrystals embedded in amorphous matrices, either semiconducting ~Ge! or dielectric (Al2O3). For the Bi:Ge films ~metal in an absorbing host!, the values obtained for ...

architecture and engineering of nanoscale sculptured thin films and determination of their properties

چکیده ندارد.

Spectroscopic ellipsometry of metal phthalocyanine thin films.

Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-...

Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air.

The ratio rho(t) = T(p)/T(s) of the complex amplitude transmission coefficients for the p and s polarizations of a transparent unbacked or embedded thin film is examined as a function of the film thickness-to-wavelength ratio d/lambda and the angle of incidence Phi for a given film refractive index N. The maximum value of the differential transmission phase shift (or retardance), Delta(t) = arg...

Simple and direct determination of complex refractive index and thickness of unsupported or embedded thin films by combined reflection and transmission ellipsometry at 45° angle of incidence